Leed products for studying sample symmetry and structure by diffraction patterns and Auger spectroscopy.
High performance VUV photon sources, easily integrated into custom builds and dedicated ESCA system solutions.
X-ray sources for photoelectron spectroscopy applications. All sources are available as integrated part of XPS instruments or as standalone components.onents.
Electron beam evaporators (EFM-Series) for ultra-clean thin layer deposition with integrated flux-feedback control.
Ion Sources to suit a range of applications from sample cleaning and depth profiling
A range of components and consumables for EFM, SPM, and UHV Systems
Transportation of samples under UHV conditions
Etching tool for SPM tunneling tips.
E-beam cleaning tool for SPM tunneling tips. The high temperature heater to remove etching remains or oxides.