• Electron Diffraction

    Leed products for studying sample symmetry and structure by diffraction patterns and Auger spectroscopy.

  • UV Sources

    High performance VUV photon sources, easily integrated into custom builds and dedicated ESCA system solutions.

     

  • X-Ray Sources

    X-ray sources for photoelectron spectroscopy applications. All sources are available as integrated part of XPS instruments or as standalone components.onents.

  • Electron-Beam Evaporators

    Electron beam evaporators (EFM-Series) for ultra-clean thin layer deposition with integrated flux-feedback control.

     

  • Ion Sources

    Ion Sources to suit a range of applications from sample cleaning and depth profiling

     

  • Spare Parts

    A range of components and consumables for EFM, SPM, and UHV Systems

  • Electron Sources

    Electron Sources for Charge neutralisation, SEM and Auger applications.

     

  • Vacuum Suitcase

    Transportation of samples under UHV conditions

  • Tip Etching Tool

    Etching tool for SPM tunneling tips. 

  • Tip Preparation Tool for SPM

    E-beam cleaning tool for SPM tunneling tips. The high temperature heater to remove etching remains or oxides.

© Scienta Omicron GmbH - All rights reserved

ImpressumTerms & Conditions

                

 

 


SPECTALEED

B003700

B003701

B002971

B000014

B002744

B003702

B001961

MCP-LEED

B003709

B003710

B002978

B002907

B000015

B000016

B002744

B003703

B001961

Electron Diffraction

SPECTALEED

SPA-LEED

MCP-LEED

LEEDLab and LEEDCal

UV Sources

HIS13 UV Source

HIS14HD UV Source

X-Ray Sources

DAR400

DAR450

Electron-Beam Evaporators

EFM3, 3i, 3s

EFM4

Triple EFM

EFM-H

EFM6

Ion Sources

ISE 5

FDG15

FDG150

EFM Spares

B000910

B002916

B001986

B000448

B001259

B000434

B000432

B000433

B000435

B000425

B000426

B000427

B003083

B000430

B000431

UHV System Spares

PN05555-S

PN04467-S

PN00447-S

PN04475-S

PN04469-S

PN04470-S

SPM Spares

S2701-S

S2832-S

S2664-S

S2833-S

PN05931-S

R192945-S

R192130-S

R192946-S

R194336-S

R194337-S

PN05930-S

R201789-S

R201869-S

Spare Parts

EFM Spares

UHV System Spares

SPM Spares

Electron Sources

CN10

Home

Electron Diffraction

UV Sources

X-Ray Sources

Electron-Beam Evaporators

Ion Sources

Spare Parts

Electron Sources

Vacuum Suitcase

Tip Etching Tool

Tip Preparation Tool for SPM

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