Leed products for studying sample symmetry and structure by diffraction patterns and Auger spectroscopy.
High performance VUV photon sources, easily integrated into custom builds and dedicated ESCA system solutions.
X-ray sources for photoelectron spectroscopy applications. All sources are available as integrated part of XPS instruments or as standalone components.onents.
Electron beam evaporators (EFM-Series) for ultra-clean thin layer deposition with integrated flux-feedback control.
Ion Sources to suit a range of applications from sample cleaning and depth profiling
A range of components and consumables for EFM, SPM, and UHV Systems
Electron Sources for Charge neutralisation, SEM and Auger applications.
Transportation of samples under UHV conditions
Etching tool for SPM tunneling tips.
E-beam cleaning tool for SPM tunneling tips. The high temperature heater to remove etching remains or oxides.